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Focused ion beam (FIB) in situ lift-out (INLO) technique showing the

4.8 (144) · $ 14.00 · In stock

Focused ion beam (FIB) in situ lift-out (INLO) technique showing the
In situ lift-out of a sample piece by means of a nanomanipulator

In situ lift-out of a sample piece by means of a nanomanipulator

76043-01

76043-01

Ceramics, Free Full-Text

Ceramics, Free Full-Text

Recent advances in focused ion beam technology and applications

Recent advances in focused ion beam technology and applications

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys  via Electron Microscopy

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

SEM and FIB-TEM analyses on nanoparticulate arsenian pyrite

SEM and FIB-TEM analyses on nanoparticulate arsenian pyrite

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and  Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

Recent advances in focused ion beam technology and applications

Recent advances in focused ion beam technology and applications

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and  Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

Ashley PAZ Y PUENTE, Assistant Professor, PhD Materials Science and Engineering (Northwestern), University of Cincinnati, Ohio, UC, Mechanical and Materials Engineering

Focused Ion Beam Technology - an overview

Focused Ion Beam Technology - an overview