Focused ion beam (FIB) in situ lift-out (INLO) technique showing

FIB milling with liftout

FIB Lift-Out for Defect Analysis

Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

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Microstructural Characterization of U-Nb-Zr, U-Mo-Nb, and U-Mo-Ti Alloys via Electron Microscopy

FIB thinning ‒ CIME ‐ EPFL

Recent advances in focused ion beam technology and applications

Focused ion beam micromachining of eukaryotic cells for